Scanning Electron Microscope and Atomic Force Microscope solutions from CIQTEK — from tungsten-filament SEM to Field-Emission and Focused Ion Beam systems, resolving structures down to 0.6 nm.
A dependable entry into electron microscopy delivering high-contrast imaging for routine analysis, education and quality control.
Adds a low-vacuum mode for non-conductive and outgassing samples, with excellent low-kV performance for surface-sensitive imaging.
A high-performance tungsten system with In-lens detection for superior low-voltage resolution and fine surface detail.
A versatile analytical FE-SEM supporting a full detector suite for morphology, composition and crystallography in a single platform.
Ultra-high resolution with In-lens detection and 2.5 million× magnification for the most demanding nano-characterization.
Our finest resolving power — 0.6 nm at 15 kV — engineered for cutting-edge research in semiconductors, energy materials and life sciences.
A dual-beam platform combining electron imaging with a gallium ion column for precise cross-sectioning, TEM lamella preparation and 3D nano-machining.
Real micrographs captured on CIQTEK electron microscopes across materials and life science. Click any image to view it larger.
Tungsten-filament SEMs such as the SEM 2100 are a dependable, cost-effective choice for routine imaging and QC. Field-emission SEMs reach far higher resolution — the SEM 5000x resolves 0.6 nm at 15 kV — for demanding nano-characterization.
Yes. The SEM 3200 includes a low-vacuum mode for non-conductive and outgassing samples.
Yes. Systems can be equipped with detectors such as EDS for elemental analysis; the SEM 4000Pro supports a full detector suite for morphology, composition and crystallography.
The DB 550 dual-beam system combines electron imaging with a gallium ion column for precise cross-sectioning, TEM lamella preparation and 3D nano-machining.
Our specialists will help you choose the right SEM configuration for your resolution, throughput and budget.
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