Scanning Electron Microscope

and

Atomic Force Microscope

CIQTEK Scanning Electron Microscope

Tungsten Filament Scanning Electron Microscope (W SEM)

SEM 2100

Magnification : 1-300,000x

Detector : SE,BSE,EDS

Resolution

3 nm @ 20 kV, SE

4 nm @ 20 kV, BSE



SEM3200

Magnification : 1-300,000x

Detector : SE,Low vac,BSE,EDS

Resolution

3 nm @ 30 kV, SE

7 nm @ 3 kV, SE

4 nm @ 30 kV, BSE

3 nm @ 30 kV, SE, 30 Pa

SEM 3300

Magnification : 1-300,000x

Detector : SE,Inlens,BSE,EDS

Resolution

2.5 nm @ 15 kV, SE

4 nm @ 3 kV, SE

5 nm @ 1 kV, SE



Field Emission Scanning Electron Microscope (FE SEM)

SEM 4000Pro

Magnification : 1-1,000,000x

Detector : SE,BSE,EDS,Low vac , EBSD STEM,CL

Resolution

0.9 nm @ 30 kV, SE

2.5 nm @ 30 kV, BSE, 30 Pa

1.5 nm @ 30 kV, SE, 30 Pa

SEM 5000Pro

Magnification : 1-2,500,000x

Detector : SE,Inlens,BSE,EDS,EBSD STEM,CL

Resolution

0.7 nm @ 15 kV, SE

1.1 nm @ 1.0 kV, SE

SEM 5000x

Magnification : 1-2,500,000x

Detector : SE,Inlens,BSE,EDS,EBSD STEM,CL

Resolution

0.6 nm @ 15 kV, SE

1.0 nm @ 1 kV, SE



Ceramic, 10 kV / ETD

Non-destructive 500 V imaging of lithium-ion battery polymer membrane fibers under the surface-sensitive condition

Mesoporous Silica

1 kV (Duo-Dec) / lnlens

Chip, 5kV / ETD

Polymer magnetic beads, with poor conductivity, characterized using a low-voltage at 2 kV with Everhart-Thornley Detector (ETD) for the characterization of biologically targeted drug delivery

Waveguide

1 kV / ETD-SE

Focused Ion Beam SEM

DB 550

Electron System

Magnification : 1-2,500,000x

Detector : SE,Inlens,BSE,EDS,EBSD STEM,CL

Resolution

0.6 nm @ 15 kV, SE

1.0 nm @ 1 kV, SE



Ion Beam System

Ion Source Type : Gallium

Resolution : 3 nm @ 30 kV

Acceleration Voltage : 0.5 kV to 30 kV

Optional : Nano-manipulator

Gas Injection System

Plasma Cleaner



Cross-Section Observation

Lamella Lift-out by Nano-Manipulator

TEM Specimen Preparation